The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2023
Filed:
Mar. 16, 2021
Fujifilm Corporation, Tokyo, JP;
Shuhei Horita, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided are a learning data collection apparatus, a learning data collection method, and a program for collecting learning data to be used for efficient retraining. A learning data collection apparatus () includes an inspection image acquisition unit () that acquires an inspection image, a region detection result acquisition unit (damage detection result acquisition unit ()) that acquires a region detection result the region detection result indicating a region detected by a region detector that is trained, a correction history acquisition unit () that acquires a correction history of the region detection result, a calculation unit () that calculates correction quantification information obtained by quantifying the correction history, a database that stores the inspection image, the region detection result, and the correction history in association with each other, an image extraction condition setting unit () that sets a threshold value of the correction quantification information as an extraction condition, the extraction condition being a condition for extracting the inspection image to be used for retraining from the database, and a first learning data extraction unit () that extracts, as learning data for retraining the region detector, the inspection image satisfying the extraction condition and the region detection result and the correction history that are associated with the inspection image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile