The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2023
Filed:
Dec. 12, 2018
Applicants:
Vineland Research and Innovation Centre, Vineland Station, CA;
National Optics Institute, Quebec, CA;
Inventors:
Assignee:
Other;
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); A01G 18/00 (2018.01); G01N 33/02 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); A01G 18/00 (2018.02); G01N 33/02 (2013.01); G06T 7/97 (2017.01); G06T 2207/10016 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/30128 (2013.01);
Abstract
A method of determining ripeness of a growing mushroom involves obtaining a sequence of images of a growing mushroom over a period of time and, from the sequence of images, measuring one or more features of the growing mushroom to obtain temporal measurements for the one or more features. The temporal measurements indicate rates at which the one or more features are changing. The temporal measurements are compared to pre-determined ripeness functions to determine the ripeness of the mushroom. The mushroom is picked if the comparison indicates that the mushroom is ready to be harvested.