The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2023
Filed:
Apr. 22, 2020
International Business Machines Corporation, Armonk, NY (US);
Lior Horesh, North Salem, NY (US);
Kenneth L. Clarkson, Madison, NJ (US);
Cristina Cornelio, White Plains, NY (US);
Sara Magliacane, Peekskill, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A method for optimal design of experiments for joint model selection and parametrization determination of a symbolic mathematical model includes: determining a prediction value for a given inquiry data point, functional form and parameterization for conducting an experiment relating to a system under investigation; assuming a set of input-output data pairs as a starting point in a model discovery process relating to the system under investigation; performing discovery of symbolic models minimizing complexity for a bounded misfit, or minimizing a misfit measure, subject to bounded complexity; determining a new data point through optimal experimental design that informs best as for the underlying symbolic models; and updating a posterior distribution, given results of the experiment relating to the system under investigation for the determined new data point to enable informed assessment among a plurality of functional forms and parameterizations. An apparatus configured to perform the method is also provided.