The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2023
Filed:
Oct. 23, 2020
Mitsubishi Electric Corporation, Tokyo, JP;
Tomoharu Takeuchi, Tokyo, JP;
MITSUBISHI ELECTRIC CORPORATION, Tokyo, JP;
Abstract
A deviation inclination calculation unit () calculates a deviation score by using evaluation data obtained from a subject apparatus as an input, in each of a plurality of outlier detection methods specifying data deviated from other data from among subject data, and calculating deviation scores indicating deviation degrees of the data specified, and calculates deviation inclination information from the deviation scores calculated. An abnormality detection unit () calculates, for each abnormality pattern, a similarity degree between deviation sensitivity information indicating sensitivity for each of a plurality of abnormality patterns with respect to each of the plurality of outlier detection methods, and the deviation inclination information calculated, and detects an abnormality of the subject apparatus.