The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2023
Filed:
Apr. 02, 2021
Parasoft Corporation, Monrovia, CA (US);
Nathan Michael Jakubiak, Pasadena, CA (US);
Anthony David Yoshicedo, Honolulu, HI (US);
Joseph Adam Benken, San Dimas, CA (US);
PARASOFT CORPORATION, Monrovia, CA (US);
Abstract
System and method for element locator recommendations for testing a UI application include: executing tests; monitoring tests and observing which commands are called by each test to generate monitored data, where the monitored data includes which tests were executed, element locators that were used in the tests, relevant commands that were called by each test and related to the element locators that were used in the tests, and information about the UI application during the test execution; storing the monitored data; analyzing the stored monitored data; producing a set of recommended element locators to be used in place of previously used element locators for which the elements were not found during the execution of the tests; and utilizing the set of recommended element locators to complete the testing of the UI application software.