The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2023

Filed:

Nov. 28, 2019
Applicant:

Zte Corporation, Shenzhen, CN;

Inventors:

Hongzhang Yang, Shenzhen, CN;

Yaofeng Tu, Shenzhen, CN;

Yahui Yang, Shenzhen, CN;

Zhongliang Li, Shenzhen, CN;

Bin Guo, Shenzhen, CN;

Assignee:

ZTE CORPORATION, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/10 (2006.01); G06F 11/07 (2006.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01); G06F 18/214 (2023.01);
U.S. Cl.
CPC ...
G06F 11/1092 (2013.01); G06F 11/076 (2013.01); G06F 11/0772 (2013.01); G06F 11/3034 (2013.01); G06F 11/3055 (2013.01); G06F 11/3452 (2013.01); G06F 11/3466 (2013.01); G06F 18/214 (2023.01);
Abstract

Disclosed are method and apparatus for predicting hard disk fault occurrence time of hard disk failure, and storage medium. The method includes steps of: screening a hard disk on the verge of failure from a plurality of hard disks according to state data acquired of hard disks; calculating variation quantity and discrete quantity of each piece of the state data of the hard disk on the verge of failure acquired over a first preset period of time, to obtain a first predicted data set; and inputting the first predicted data set into a first training model to obtain probability of occurrence of failure for the hard disk on the verge of failure over a future second preset period of time.


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