The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2023

Filed:

Dec. 03, 2021
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Joshua M Rosenkranz, White Plains, NY (US);

Pranita Sharad Dewan, New York, NY (US);

Mudhakar Srivatsa, White Plains, NY (US);

Praveen Jayachandran, Bangalore, IN;

Chander Govindarajan, Chennai, IN;

Priyanka Prakash Naik, Mumbai, IN;

Kavya Govindarajan, Chennai, IN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/076 (2013.01); G06F 11/079 (2013.01); G06F 11/0709 (2013.01);
Abstract

An ensemble of autoencoder models can be trained using different seeds. The trained ensemble of autoencoder models can be run on new time series data to generate a prediction associated with the new time series data. The new time series data can include multiple dimensions per time step. Reconstruction errors can be determined for the prediction. Dimensions having highest reconstruction errors can be selected among the multiple dimensions based on a threshold. The prediction can be segmented based on bursts of the reconstruction errors over time, where temporal segments can be obtained. At least one common pattern including a set of dimensions among the selected dimensions across the temporal segments can be obtained to represent a failure fingerprint.


Find Patent Forward Citations

Loading…