The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2023

Filed:

Jan. 21, 2019
Applicant:

Nxp B.v., Eindhoven, NL;

Inventors:

Maxim Kulesh, Hamburg, DE;

Mark Steigemann, Ebstofr, DE;

Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/486 (2020.01); G01S 17/10 (2020.01); G01S 17/02 (2020.01); G01S 7/4863 (2020.01); G01S 17/04 (2020.01);
U.S. Cl.
CPC ...
G01S 7/4863 (2013.01); G01S 17/04 (2020.01); G01S 17/10 (2013.01);
Abstract

Various example embodiments are directed to apparatuses and methods including an apparatus having sensor circuitry and processing circuitry. In one example, sensor circuitry produces and senses detected signals corresponding to physical objects located in an operational region relative to a location of the sensor circuitry. The processing circuitry records and organizes information associated with the detected signals in a plurality of sub-histograms respectively associated with different accuracy metrics for corresponding sub-regions of the operational region, each of the plurality of sub-histograms including a set of histogram bins characterized by a bin width linked to its accuracy metric, and refines at least one of the accuracy metric by adapting one or more of the bin widths dynamically in response to the detected signals.


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