The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2023

Filed:

Jul. 11, 2019
Applicant:

Lg Chem, Ltd., Seoul, KR;

Inventors:

Ji Hye Park, Daejeon, KR;

Seok Koo Kim, Daejeon, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/367 (2019.01); H01M 10/0525 (2010.01); G01R 31/396 (2019.01); H01M 4/13 (2010.01); G01R 31/392 (2019.01); H01M 4/02 (2006.01); G01N 27/04 (2006.01);
U.S. Cl.
CPC ...
G01R 31/367 (2019.01); G01N 27/041 (2013.01); H01M 10/0525 (2013.01); G01N 27/04 (2013.01); G01R 31/392 (2019.01); G01R 31/396 (2019.01); H01M 4/02 (2013.01); H01M 4/13 (2013.01); Y02E 60/10 (2013.01);
Abstract

The present invention discloses a method for determining dispersibility, comprising (a) selecting two random points (-') of an electrode material layer, (b) finding a difference Δof an absolute value of two voltage values by measuring voltages between the two points (-′) in different current directions, (c) selecting two other random points (-′ to n-n′, where n is an integer that is equal to or greater than 2) that are different from two points selected in the process (a) and, and repeating the processes (a) and (b) at least once to find Δto Δn, (d) finding a mean value of differences Δto Δn of the absolute values obtained by repeating the process (b) and the process (c), and (e) finding a standard deviation of Δto Δn from the mean value.


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