The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2023

Filed:

Feb. 26, 2020
Applicant:

Tdk Corporation, Tokyo, JP;

Inventors:

Tomohiro Honya, Tokyo, JP;

Masataka Midori, Tokyo, JP;

Hiroshi Kurihara, Tokyo, JP;

Assignee:

TDK CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/04 (2006.01); G01R 29/10 (2006.01);
U.S. Cl.
CPC ...
G01R 29/105 (2013.01);
Abstract

An electromagnetic wave measurement point calculation program causing a computer to execute: a correction coefficient calculating function of calculating a correction coefficient for which an interval of heights of an antenna satisfies a sampling theorem based on a relative positional relation between a test body including a radiation source radiating a radiation interference wave and the antenna performing measurement of at least one of an electric field and a magnetic field of the radiation interference wave and a reflection coefficient of the radiation interference wave on a floor face on which the test body is placed; and a measurement height calculating function of sequentially calculating the heights of the antenna in a case in which the measurement is performed using the correction coefficient.


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