The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2023
Filed:
May. 02, 2019
Dexcom, Inc., San Diego, CA (US);
Naresh C. Bhavaraju, San Diego, CA (US);
Becky L. Clark, San Diego, CA (US);
Vincent P. Crabtree, San Diego, CA (US);
Chris W. Dring, San Diego, CA (US);
Arturo Garcia, Chula Vista, CA (US);
Jason Halac, San Diego, CA (US);
Jonathan Hughes, Encinitas, CA (US);
Jeff Jackson, Poway, CA (US);
Lauren Hruby Jepson, San Diego, CA (US);
David I-Chun Lee, San Diego, CA (US);
Ted Tang Lee, San Diego, CA (US);
Rui Ma, San Diego, CA (US);
Zebediah L. McDaniel, San Diego, CA (US);
Jason Mitchell, Poway, CA (US);
Andrew Attila Pal, San Diego, CA (US);
Daiting Rong, San Diego, CA (US);
Disha B. Sheth, Oceanside, CA (US);
Peter C. Simpson, Cardiff, CA (US);
Stephen J. Vanslyke, Carlsbad, CA (US);
Matthew D. Wightlin, San Diego, CA (US);
Anna Leigh Davis, Cardiff by the Sea, CA (US);
Hari Hampapuram, San Diego, CA (US);
Aditya Sagar Mandapaka, San Diego, CA (US);
Alexander Leroy Teeter, Poway, CA (US);
Liang Wang, La Jolla, CA (US);
Dexcom, Inc., San Diego, CA (US);
Abstract
Systems and methods are provided that address the need to frequently calibrate analyte sensors, according to implementation. In more detail, systems and methods provide a preconnected analyte sensor system that physically combines an analyte sensor to measurement electronics during the manufacturing phase of the sensor and in some cases in subsequent life phases of the sensor, so as to allow an improved recognition of sensor environment over time to improve subsequent calibration of the sensor.