The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2023

Filed:

Sep. 13, 2021
Applicants:

Hyundai Motor Company, Seoul, KR;

Kia Corporation, Seoul, KR;

Foundation for Research and Business, Seoul National University of Science and Technology, Seoul, KR;

Inventors:

Young Sam Yoon, Hwaseong-si, KR;

Ji Su Park, Gyeonggi-do, KR;

Ki Ho Yum, Seoul, KR;

Sung Dae Kim, Gyeonggi-do, KR;

Kyu Ho Sim, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 17/02 (2006.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G01M 17/02 (2013.01); G06F 17/18 (2013.01);
Abstract

A method of matching a wheel and a tire includes steps of: measuring inner runout and outer runout of a wheel; extracting and setting a primary component of a measurement waveform of the inner runout as an inner runout waveform and extracting and setting a primary component of a measurement waveform of the outer runout as an outer runout waveform; comparing an inner minimum value that is a minimum value of the inner runout waveform and an outer minimum value that is the minimum value of the outer runout waveform with a predetermined runout reference value; and determining an assembly reference position of the wheel based on the inner minimum value or the outer minimum value or based on a resultant waveform of the inner runout waveform and the outer runout waveform, depending on a result of the comparing step.


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