The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2023
Filed:
Jul. 01, 2021
Applicant:
Virtek Vision International, Ulc, Waterloo, CA;
Inventor:
Kurt D Rueb, Kitchener, CA;
Assignee:
VIRTEK VISION INTERNATIONAL INC., Waterloo, CA;
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2022.01);
U.S. Cl.
CPC ...
G01B 9/02094 (2013.01); G01B 9/02083 (2013.01);
Abstract
A method for validating the placement of pieces in an assembly task by scanning a coherent light source, such as a laser, over a surface and characterizing the detected interference speckle pattern to discriminate the position of the placed piece from the surface on which the piece is placed. This discrimination is possible even if the characteristic features of the piece and background are smaller than the resolution of the scanning system. In addition, characteristics of the piece, such as the orientation of fibers in the material, may be sensed by classification of the associated speckle response.