The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2023
Filed:
Mar. 28, 2022
Applicant:
Silgan White Cap Llc, Downers Grove, IL (US);
Inventor:
Thomas C. Schafer, Des Plaines, IL (US);
Assignee:
Silgan White Cap LLC, Downers Grove, IL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B67B 3/00 (2006.01); B67B 3/26 (2006.01); G01N 21/90 (2006.01); B65G 43/08 (2006.01); B65G 15/50 (2006.01); B07C 5/34 (2006.01);
U.S. Cl.
CPC ...
B67B 3/265 (2013.01); B07C 5/3408 (2013.01); B65G 15/50 (2013.01); B65G 43/08 (2013.01); G01N 21/90 (2013.01);
Abstract
A system of measuring a top surface of a closure to determine if the closure is properly affixed to a container. Multiple paths of measurements may be collected and analyzed. In various analysis paradigms, measurements on a given path are separated into different sets, such as a leading set that generally includes the first third of measurements, a trailing set that includes the trailing set of measurements, and a middle set that includes the middle third of measurements. Several methods of analysis may be based on a presumption that a properly affixed closure is symmetrical or near symmetrical.