The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2023

Filed:

Jan. 09, 2020
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Mikito Hane, Yamanashi, JP;

Takashi Satou, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01); G05B 13/02 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1633 (2013.01); B25J 9/163 (2013.01); B25J 9/1674 (2013.01); G05B 13/0265 (2013.01); B25J 9/1687 (2013.01);
Abstract

A determination apparatus acquires, as acquired data, the state of force and moment applied to a manipulator and the state of the position and the posture in an operation when a force control of an industrial robot is carried out, and creates an evaluation function that evaluates the quality of the operation of the industrial robot based on the acquired data. Then, it creates determination data for the acquired data using the evaluation function, and creates state data used for machine learning based on the acquired data. Then, it generates a learning model for determining a quality of an operation of the industrial robot using the state data and the determination data.


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