The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2023

Filed:

Sep. 12, 2019
Applicant:

Medtronic Minimed, Inc., Northridge, CA (US);

Inventors:

Akhil Srinivasan, Pacific Palisades, CA (US);

Peter Ajemba, Canyon Country, CA (US);

Steven C. Jacks, Culver City, CA (US);

Robert C. Mucic, Glendale, CA (US);

Tyler R. Wong, Pasadena, CA (US);

Melissa Tsang, Sherman Oaks, CA (US);

Chi-En Lin, Van Nuys, CA (US);

Mohsen Askarinya, Chandler, AZ (US);

David Probst, Chandler, AZ (US);

Assignee:

MEDTRONIC MINIMED, INC., Northridge, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/1495 (2006.01); A61B 5/145 (2006.01); A61M 5/172 (2006.01); A61M 5/142 (2006.01); A61B 5/00 (2006.01); G16H 20/17 (2018.01);
U.S. Cl.
CPC ...
A61M 5/1723 (2013.01); A61B 5/1495 (2013.01); A61B 5/14532 (2013.01); A61M 5/14244 (2013.01); A61B 5/145 (2013.01); A61B 5/4839 (2013.01); A61B 2560/0223 (2013.01); A61B 2560/0228 (2013.01); A61B 2560/0238 (2013.01); A61M 2005/14208 (2013.01); G16H 20/17 (2018.01);
Abstract

Medical devices and related systems and methods are provided. A method of calibrating an instance of a sensing element involves obtaining fabrication process measurement data from a substrate having the instance of the sensing element fabricated thereon, obtaining a calibration model associated with the sensing element, determining calibration data associated with the instance of the sensing element for converting the electrical signals into a calibrated measurement parameter based on the fabrication process measurement data using the calibration model, and storing the calibration data in a data storage element associated with the instance of the sensing element.


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