The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2023

Filed:

May. 24, 2021
Applicant:

Align Technology, Inc., San Jose, CA (US);

Inventors:

Fuming Wu, Pleasanton, CA (US);

Vadim Matov, San Jose, CA (US);

Jihua Cheng, San Jose, CA (US);

Assignee:

Align Technology, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61C 13/00 (2006.01); G16Z 99/00 (2019.01); A61C 7/00 (2006.01); G06F 30/00 (2020.01);
U.S. Cl.
CPC ...
A61C 13/0004 (2013.01); A61C 7/002 (2013.01); G16Z 99/00 (2019.02); A61C 2007/004 (2013.01); G06F 30/00 (2020.01);
Abstract

A scan model that is a mathematical model to simulate an imaging process performed by an x-ray imaging device that created a two-dimensional x-ray image of at least one tooth is generated. The scan model uses an initial estimate of one or more parameters of the x-ray imaging device. The one or more parameters include a scan angle parameter indicative of a scan angle of the x-ray imaging device. A two-dimensional contour of a three-dimensional model is adjusted to cause a first component of the two-dimensional contour to approximately align with a second component of the two-dimensional x-ray image. The scan model is calibrated based on data obtained from adjusting the two-dimensional contour.


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