The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Mar. 03, 2020
Applicant:

Nikon Corporation, Tokyo, JP;

Inventors:

Wan Qin, Oro Valley, AZ (US);

Brian Stamper, Tucson, AZ (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); A61B 3/00 (2006.01); G06V 40/18 (2022.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); A61B 3/0025 (2013.01); G06V 40/193 (2022.01);
Abstract

An assessment assembly () for assessing a fundus imaging system () includes at least one, curved, flexible resolution test chart (). Each of the resolution test charts () can include a chart body (), and a plurality of spaced apart chart features (). Moreover, each of the resolution test charts () can be fixedly coupled to an artificial retina region () of an artificial eye (). The artificial retina region () can be shaped and sized similar to a retina region (E) of a human eye (), and the artificial retina region () can have scattering and depolarization properties that are similar to the scattering and depolarization properties of the retina region (E) of the human eye (). The fundus imaging system () can capture one or more images () of the resolution test charts () that are evaluated to determine a resolution of the fundus imaging system ().


Find Patent Forward Citations

Loading…