The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Mar. 30, 2021
Applicant:

Bae Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);

Inventors:

Jeffrey L. Jew, Brookline, NH (US);

Michael A. Costolo, Amherst, NH (US);

Adam O. Powers, Manchester, NH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/33 (2023.01); H04N 5/06 (2006.01);
U.S. Cl.
CPC ...
H04N 5/33 (2013.01); H04N 5/06 (2013.01);
Abstract

Techniques for reducing a likelihood of detection of an imaging system by another imaging system are provided. For example, the techniques may include controlling read-out such that the timings between frames of an image are non-uniform. For example, a processor may be configured to generate a plurality of frame synchronization signals from a main clock and transmit the plurality of frame synchronization signals to readout circuitry. Each frame synchronization signal is an instruction to start the biasing and reading for a respective frame. The plurality of frame synchronization signals may be generated such that a timing between pulse biasing the same thermal sensor is not uniform. The techniques may also include controlling the read-out such that the timings between lines within a frame are non-uniform which also results in the timing between pulse biasing of the same thermal sensor not being uniform.


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