The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Apr. 04, 2022
Applicants:

Hirofumi Ono, Kanagawa, JP;

Yutaka Ohmiya, Tokyo, JP;

Inventors:

Hirofumi Ono, Kanagawa, JP;

Yutaka Ohmiya, Tokyo, JP;

Assignee:

RICOH COMPANY, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/00 (2006.01); H04N 1/195 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00702 (2013.01); H04N 1/00718 (2013.01); H04N 1/00734 (2013.01); H04N 1/00774 (2013.01); H04N 1/19584 (2013.01); H04N 2201/04717 (2013.01);
Abstract

A position sensing apparatus and a method of detecting a position. The position sensing apparatus includes a scanner configured to emit light to an object to scan an image of the object, and a position detector. In the position sensing apparatus, the scanner outputs a first result of scanning obtained by irradiating the object with visible light and a second result of scanning obtained by irradiating the object with invisible light to the position detector, and the position detector corrects the second result of scanning based on the first result of scanning, and to detect an invisible alignment image based on the corrected second result of scanning. The method includes emitting light to an object using a scanner, obtaining a first result of scanning as the scanner irradiates the object with visible light, and obtaining a second result of scanning as the scanner irradiates the object with invisible light.


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