The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Dec. 07, 2021
Applicant:

Rakuten Mobile, Inc., Tokyo, JP;

Inventors:

Mayank Sant, Tokyo, JP;

Rahul Atri, Singapore, SG;

Kunal Khanwilkar, Singapore, SG;

Eswara Reddy Kotha, Tokyo, JP;

Phuong Thanh Bui, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 43/50 (2022.01); H04L 43/0823 (2022.01);
U.S. Cl.
CPC ...
H04L 43/50 (2013.01); H04L 43/0823 (2013.01);
Abstract

A method and/or system may receive a test application to be tested on a wireless communication network. The method and/or system may obtain a test design for the test application. The test design may include at least one performance parameter. The method and/or system may define at least one slice of the wireless communication network to test the test application based on the test design. The at least one slice of the wireless communication network may include at least one test wireless network service (e.g. a radio access network). The method and/or system may perform at least one performance test on the at least one slice of the wireless communication network for the test application based on the at least one performance parameter. By designating performance parameters in test designs, the testing may be optimally effective, efficient, and practical.


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