The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Feb. 02, 2021
Applicant:

Adva Optical Networking SE, Meiningen, DE;

Inventors:

Michael Eiselt, Kirchheim, DE;

Mirko Lawin, Meiningen, DE;

Florian Azendorf, Meiningen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/071 (2013.01); H04B 10/50 (2013.01);
U.S. Cl.
CPC ...
H04B 10/071 (2013.01); H04B 10/50 (2013.01);
Abstract

The present disclosure relates to an optical time domain reflectometry method including the steps of feeding a plurality of unipolar optical probe signals to a near end of an optical path under test, receiving a corresponding plurality of reflected unipolar optical receive signals, creating a corresponding plurality of digital receive data signals, calculating at least one correlation signal by correlating the digital receive data signals with a bit sequence corresponding to a respective probe bit sequence, and determining the signal propagation delay between the near end of the optical path and a respective reflective position. The present disclosure also relates to an optical time domain reflectometry system in which this method is implemented and a computer program having instructions to cause the optical time domain reflectometer and to execute the method herein.


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