The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2023
Filed:
Sep. 10, 2018
Konica Minolta, Inc., Tokyo, JP;
Masahiro Imada, Tokyo, JP;
Takuji Hatano, Osaka, JP;
Koujirou Sekine, Osaka, JP;
Masaaki Tsuchida, Tokyo, JP;
Tsukasa Yagi, Hyogo, JP;
KONICA MINOLTA, INC, Tokyo, JP;
SPIN SENSING FACTORY CORP., Sendai, JP;
Abstract
A non-destructive inspection method of inspecting an inspection target using multiple different types of non-destructive inspection means that include one non-destructive inspection means and at least one other non-destructive inspection means. The method includes determining a marking position on the inspection target in a detection result by the one non-destructive inspection means, causing a device to store the marking position, and fixedly forming a mark on the inspection target corresponding to the marking position. The mark is detectable by the other non-destructive inspection means. The method further includes causing the other non-destructive inspection means to inspect an inspection target including the mark. The method further includes contrasting detection results by the multiple different types of non-destructive inspection means in reference to the mark which is the marking position.