The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Oct. 21, 2020
Applicant:

Konica Minolta, Inc., Tokyo, JP;

Inventor:

Satoshi Masuda, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 5/00 (2006.01);
U.S. Cl.
CPC ...
G09G 5/003 (2013.01); G09G 2354/00 (2013.01); G09G 2360/141 (2013.01);
Abstract

Provided with: a detecting means to detect a possible light intensity changing frequency of a measuring object; a frequency determining means to determine a light intensity changing frequency with reference to the possible light intensity changing frequency; a resolution determining means to determine a frequency resolution for flicker measuring with reference to the determined light intensity changing frequency; and a flicker measuring means to conduct flicker measuring with the determined frequency resolution. The resolution determining means determines the frequency resolution to be an integral submultiple of the light intensity changing frequency determined by the frequency determining means.


Find Patent Forward Citations

Masuda, Satoshi. (2023). Flicker measurement device and measurement method (U.S. Patent No. 11651747). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11651747

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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