The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Sep. 26, 2018
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Toru Takahashi, Tokyo, JP;

Yuta Kudo, Tokyo, JP;

Kengo Makino, Tokyo, JP;

Rui Ishiyama, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/40 (2017.01); G06V 10/75 (2022.01); G06T 7/80 (2017.01); G06T 7/33 (2017.01); G06V 10/40 (2022.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G06V 10/751 (2022.01); G06K 9/6215 (2013.01); G06T 7/337 (2017.01); G06T 7/40 (2013.01); G06T 7/80 (2017.01); G06V 10/40 (2022.01);
Abstract

An individual identification system includes: a storing unit for storing an image capture parameter in association with data characterizing a surface of a reference object; an acquiring unit that, when data characterizing a surface of an object to be matched is input, calculates an approximation degree between the input data and each data stored in the storing unit, and acquires the image capture parameter applied to the object to be matched from the storing unit based on the calculated approximation degree; a condition setting unit that sets an image capture condition determined by the acquired image capture parameter; an image capturing unit that acquires an image of the surface of the object to be matched under the set image capture condition; an extracting unit that extracts a feature value from the acquired image; and a matching unit that matches the extracted feature value against a registered feature value.


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