The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Sep. 20, 2021
Applicant:

Splunk Inc., San Francisco, CA (US);

Inventors:

Devin Bhushan, San Jose, CA (US);

Seunghee Han, San Jose, CA (US);

Caelin Thomas Jackson-King, Santa Clara, CA (US);

Jamie Kuppel, Sunnyvale, CA (US);

Stanislav Yazhenskikh, Santa Clara, CA (US);

Jim Jiaming Zhu, Scarborough, CA;

Assignee:

SPLUNK INC., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 19/00 (2011.01); G06T 15/04 (2011.01); G01S 17/89 (2020.01); G06T 17/20 (2006.01);
U.S. Cl.
CPC ...
G06T 19/006 (2013.01); G01S 17/89 (2013.01); G06T 15/04 (2013.01); G06T 17/20 (2013.01);
Abstract

Various implementations or examples set forth a method for scanning a three-dimensional (3D) environment. The method includes generating, based on sensor data captured by a depth sensor on a device, a 3D mesh representing a physical space; dividing the 3D mesh into a plurality of sub-meshes, wherein each of the plurality of sub-meshes comprises a corresponding set of vertices and a corresponding set of faces comprising edges between pairs of vertices; determining that at least a portion of a first sub-mesh in the plurality of sub-meshes is in a current frame captured by an image sensor on the device; and updating the 3D mesh by texturing the at least a portion of the first sub-mesh with one or more pixels in the current frame onto which the first sub-mesh is projected.


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