The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

May. 18, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Manish Anand Bhide, Hyderabad, IN;

Jonathan Limburn, Southampton, GB;

Harivansh Kumar, Hyderabad, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 5/02 (2023.01); G06N 5/04 (2023.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 5/02 (2013.01); G06N 5/04 (2013.01);
Abstract

Embodiments relate to a system, program product, and method for generating an enhanced feature catalog for a predictive model. The embodiments disclosed herein include capturing predictive model design time information including training data lineage metadata to determine the features of the training data, model design time measurements, and model design time metadata. Once the predictive model is built, the training data lineage metadata is used to capture the features that will be maintained within a feature catalog. The model design time measurements and model design time metadata provide further correlation between the predictive model and the features. Runtime metrics on the predictive model create additional correlations between the captured data and metadata with the features in the feature catalog to expeditiously identify the relevant features of the predictive model.


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