The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2023
Filed:
Dec. 15, 2017
Google Llc, Mountain View, CA (US);
John Martinis, Santa Barbara, CA (US);
Yu Chen, Goleta, CA (US);
Hartmut Neven, Malibu, CA (US);
Dvir Kafri, Los Angeles, CA (US);
Google LLC, Mountain View, CA (US);
Abstract
Methods, systems, and apparatus for nonlinear calibration of quantum computing apparatus. In one aspect, elements in a set of experimental data correspond to a respective configuration of control biases for the quantum computing apparatus. An initial physical model comprising one or more model parameters of the quantum computing apparatus is defined. The model is iteratively adjusted to determine a revised physical model, where at each iteration: a set of predictive data corresponding to the set of experimental data is generated, and elements in the predictive data represent a difference between the two smallest eigenvalues of a Hamiltonian characterizing the system qubits for the previous iteration, and are dependent on at least one model parameter of the physical model for the previous iteration; and the model for the previous iteration is adjusted using the obtained experimental data and the generated set of predictive data for the iteration.