The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Jul. 10, 2020
Applicants:

Battelle Memorial Institute, Richland, WA (US);

The Board of Trustees of the University of Arkansas, Little Rock, AR (US);

Inventors:

Sri Nikhil Gupta Gourisetti, Richland, WA (US);

Michael E. Mylrea, Alexandria, VA (US);

Hirak Patangia, Little Rock, AR (US);

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); H04L 9/06 (2006.01); G06F 16/27 (2019.01); H04L 9/32 (2006.01); G06Q 10/06 (2012.01); G06Q 30/00 (2012.01); G06Q 50/06 (2012.01); H04L 9/00 (2022.01); G06Q 10/0637 (2023.01); G06Q 30/018 (2023.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 16/27 (2019.01); G06Q 10/06375 (2013.01); H04L 9/0637 (2013.01); H04L 9/3236 (2013.01); G06Q 30/018 (2013.01); G06Q 50/06 (2013.01); H04L 9/50 (2022.05);
Abstract

Technology related to blockchain cybersecurity solutions and a blockchain applicability framework is disclosed. In one example of the disclosed technology, a system is configured to receive parameters for a blockchain candidate application and evaluate the parameters to determine a recommendation for types of blockchain to apply to the candidate application. The recommendation may be based on an evaluation of the parameters to determine a level of applicability of blockchain usage, a level of applicability of one or more blockchain privacy types, and a level of applicability of one or more blockchain consensus types. The system may be configured to calculate an overall percentage distribution of the levels of applicability and to output an indication of the overall percentage distribution.


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