The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Aug. 10, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Shuo Li, Beijing, CN;

Sheng Yan Sun, BeiJing, CN;

Xiaobo Wang, Beijing, CN;

Meng Wan, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/901 (2019.01);
U.S. Cl.
CPC ...
G06F 16/9024 (2019.01);
Abstract

A method, system, and computer program product for abnormal data detection. According to the method, a plurality of data points collected at different time points are classified into a plurality of groups. A plurality of groups of potential abnormal data points are determined from the plurality of groups. Correlations between a first group of the plurality of groups of potential abnormal data points with other groups of potential abnormal data points are determined. In response to the first group of the plurality of groups of potential abnormal data points being uncorrelated to a majority of the other groups of potential abnormal data points based on the correlations, data points in the first group are identified as abnormal data points.


Find Patent Forward Citations

Li, Shuo. (2023). Abnormal data detection (U.S. Patent No. 11651031). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11651031

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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