The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2023
Filed:
May. 10, 2021
Applicant:
Splunk Inc., San Francisco, CA (US);
Inventors:
Tristan Antonio Fletcher, Pacifica, CA (US);
Alok Anant Bhide, Mountain View, CA (US);
Assignee:
Splunk Inc., San Francisco, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/34 (2019.01); G06F 16/33 (2019.01); G06F 16/903 (2019.01); H04L 41/5009 (2022.01); H04L 43/04 (2022.01); H04L 41/069 (2022.01); H04L 41/50 (2022.01); G06Q 10/0639 (2023.01); G06F 3/0482 (2013.01); H04L 41/22 (2022.01); G06F 3/04842 (2022.01); H04L 69/329 (2022.01); H04L 41/0686 (2022.01); H04L 9/40 (2022.01);
U.S. Cl.
CPC ...
G06F 16/334 (2019.01); G06F 3/0482 (2013.01); G06F 3/04842 (2013.01); G06F 16/903 (2019.01); G06Q 10/06393 (2013.01); H04L 41/069 (2013.01); H04L 41/22 (2013.01); H04L 41/5009 (2013.01); H04L 41/5032 (2013.01); H04L 43/04 (2013.01); H04L 69/329 (2013.01); H04L 41/0686 (2013.01); H04L 63/145 (2013.01);
Abstract
One or more processing devices derive values indicative of various aspects of how a particular service in an information technology (IT) environment is performing at a point in time or for a period of time. The values are derived by a search query over machine data associated with the one or more entities that provide the service. The one or more processing devices define and apply time varying static thresholds in respect to the values. A user (e.g., IT manager) may be enabled to manipulate or define multiple sets of KPI thresholds that vary over time.