The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Jul. 14, 2021
Applicant:

Pure Storage, Inc., Mountain View, CA (US);

Inventors:

Asimuddin Kazi, Naperville, IL (US);

Jason K. Resch, Chicago, IL (US);

Assignee:

Pure Storage, Inc., Mountain View, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 11/10 (2006.01); H03M 13/00 (2006.01); H03M 13/05 (2006.01); G06F 3/06 (2006.01); H03M 13/37 (2006.01); H03M 13/15 (2006.01); G06F 11/00 (2006.01); G06F 11/20 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1076 (2013.01); G06F 3/064 (2013.01); G06F 3/067 (2013.01); G06F 3/0619 (2013.01); G06F 3/0644 (2013.01); G06F 11/1092 (2013.01); H03M 13/05 (2013.01); H03M 13/3761 (2013.01); H03M 13/611 (2013.01); G06F 11/008 (2013.01); G06F 11/2058 (2013.01); G06F 2211/109 (2013.01); H03M 13/1515 (2013.01);
Abstract

A method for execution by a vault management device of a storage network includes determining a failure impact level to vaults of the storage network based on a failed storage unit within the vaults, where the vaults include a first vault that is associated with a first set of storage units and a first decode threshold number, and a second vault that is associated with a second set of storage units and a second decode threshold number, and where the failure impact level is based on the number of non-failed storage units within each of the vaults. The method continues with determining a failure abatement approach based on the failure impact level. The method continues by with facilitating the failure abatement approach.


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