The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Aug. 25, 2020
Applicant:

Inspur Electronic Information Industry Co., Ltd., Shandong, CN;

Inventors:

Peng Li, Shandong, CN;

Xiangrui Meng, Shandong, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 16/16 (2019.01); G06F 16/13 (2019.01);
U.S. Cl.
CPC ...
G06F 11/0793 (2013.01); G06F 16/13 (2019.01); G06F 16/164 (2019.01);
Abstract

An abnormal index node (inode) dynamic repair method, system, and apparatus, and a readable memory medium. The method includes: obtaining an overall memory structure of an abnormal inode in a memory, and converting the overall memory structure into an editable file; determining an abnormal field in the editable file according to error reporting information; writing an expected value of a file system to a position of the abnormal field in the editable file to obtain a repaired editable file; and importing the repaired editable file back to the memory.


Find Patent Forward Citations

Li, Peng. (2023). Abnormal inode dynamic repair method and system, and related component (U.S. Patent No. 11650875). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11650875

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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