The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Dec. 25, 2019
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Hiroyuki Toriyabe, Chiba, JP;

Satoshi Yoshida, Kanagawa, JP;

Yuuki Maeda, Chiba, JP;

Takaaki Yano, Tokyo, JP;

Makoto Anno, Tokyo, JP;

Hirotomo Tanaka, Chiba, JP;

Shou Kikuchi, Chiba, JP;

Kosuke Tsujita, Tokyo, JP;

Ryo Fujita, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/12 (2006.01);
U.S. Cl.
CPC ...
G06F 3/1208 (2013.01); G06F 3/1229 (2013.01); G06F 3/1285 (2013.01);
Abstract

An information processing apparatus includes at least one processor that causes the information processing apparatus to receive image data and quality request data from an order system, transmit the image data to a production system, and receive a measurement result obtained by the production system about a measurement item specified by the quality request data from among items that are able to be notified by quality data. In addition, the quality data including the measurement result about the measurement item specified by the quality request data based on the measurement result is generated, and the quality data is transmitted to the order system.


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