The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2023
Filed:
Jul. 05, 2019
Nanjing University of Science and Technology, Jiangsu, CN;
Chao Zuo, Nanjing, CN;
Qian Chen, Nanjing, CN;
Jiasong Sun, Nanjing, CN;
Yuzhen Zhang, Nanjing, CN;
Guohua Gu, Nanjing, CN;
NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY, Jiangsu, CN;
Abstract
A microscopic imaging method of phase contrast (PC) and differential interference contrast (DIC) based on the transport of intensity equation (TIE) includes capturing three intensity images along the optical axis; solving the TIE by deconvolution to obtain the quantitative phase; obtaining the intensity image under the DIC imaging mode according to the DIC imaging principle; and obtaining the corresponding phase image of PC imaging mode according to the PC imaging principle. The method can endow the bright-field microscope with the ability to realize PC and DIC imaging without complex modification of the traditional bright-field microscope. In addition, it has the same imaging performance as the phase contrast microscope and differential interference contrast microscope, which are expensive, complex-structure, and has strict environmental conditions.