The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Nov. 13, 2020
Applicant:

Scopio Labs Ltd., Tel Aviv, IL;

Inventors:

Ben Leshem, Tel Aviv, IL;

Eran Small, Yehud, IL;

Erez Na'aman, Tel Aviv, IL;

Ittai Madar, Tel Aviv, IL;

Assignee:

SCOPIO LABS LTD., Tel Aviv, IL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/34 (2006.01); G02B 21/06 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/006 (2013.01); G02B 21/06 (2013.01); G02B 21/34 (2013.01); G02B 21/367 (2013.01);
Abstract

A microscope for computational microscopic layer separation may include an imaging device that includes a lens and an image sensor, an illumination system for illuminating a sample, and an actuator to adjust an axial position of a focal plane with respect to the sample. The microscope may also include a processor operatively coupled to the imaging device and the illumination system. The processor may be configured to measure, using the image sensor and the illumination system, optical aberrations of the imaging device at the axial position, and determine whether to adjust the focal plane with respect to the sample in response to the one or more optical aberrations. Various other systems and methods are also disclosed.


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