The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Feb. 03, 2020
Applicant:

Bentley Systems, Incorporated, Exton, PA (US);

Inventors:

Cyril Novel, Paris, FR;

Alexandre Gbaguidi Aisse, Suresnes, FR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 17/89 (2020.01); G01S 7/48 (2006.01); G06T 7/60 (2017.01); G06T 7/521 (2017.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G01S 17/89 (2013.01); G01S 7/4808 (2013.01); G06T 7/521 (2017.01); G06T 7/60 (2013.01); G06T 7/73 (2017.01); G06T 2207/10028 (2013.01);
Abstract

In an example embodiment, a process may create a disk for each point of the point cloud, where a size of the disk and the orientation of the disk are respectively based on a computed scale and a non-oriented normal. The process may insert each disk into a search structure that is queried to determine if one or more disks intersect the paths from a given point to each scanner in the point cloud. The process may create an output corresponding to each scanner in the point cloud, where each output includes the number of intersecting disks and the distance from the given point to the scanner. The process may implement a sorting algorithm to assign the given point to a scanner position. An application may utilize the assignment of each point in the point cloud to a scanner position to generate a high-resolution 3D mesh of a scene.


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