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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11650302 B1

PDFFull Text
Date of Patent:
May. 16, 2023

Filed:

Jan. 14, 2019

Method for detecting potential faulty states on an fmcw-based filling level measuring apparatus

Applicant:

Endress+hauser Se+co. KG, Maulburg, DE;

Inventors:

Manuel Sautermeister, Schopfheim, DE;

Lukas Schwörer, Schopfheim, DE;

Winfried Mayer, Buch, DE;

Assignee:

Endress+Hauser SE+Co. KG, Maulburg, DE;

Attorneys:

Mark A. Logan

Endress+Hauser (USA) Holding, Inc.

Primary Examiner:

David Z Huang

Int. Cl.
CPC ...
G01S 13/34 (2006.01); G01F 23/284 (2006.01); G01S 7/40 (2006.01); G01F 25/20 (2022.01);
U.S. Cl.
CPC ...
G01S 13/343 (2013.01); G01F 23/284 (2013.01); G01F 25/20 (2022.01); G01S 7/4004 (2013.01); G01S 7/4056 (2013.01); G01S 7/4091 (2021.05);
Abstract

Disclosed is a method for detecting a faulty state of an FMCW-based fill level measuring device. For this, a correlation coefficient is ascertained by correlation, especially cross correlation, of the measurement signal with a reference signal. The faulty state is accordingly detected when the correlation coefficient subceeds a predefined minimum value. In this way, the functioning of the fill level measuring device can be monitored with a degree of safety allowing the fill level measuring device to be applied also in process plants and measuring environments, which require extremely reliable measuring apparatuses, and measurement data.

Find Patent Forward Citations

Sautermeister, Manuel. (2023). Method for detecting potential faulty states on an fmcw-based filling level measuring apparatus (U.S. Patent No. 11650302). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11650302

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