The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Aug. 05, 2021
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Mario Zeller, Erlangen, DE;

Adam Kettinger, Bayern, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/565 (2006.01); G01R 33/56 (2006.01); G01R 33/54 (2006.01);
U.S. Cl.
CPC ...
G01R 33/56563 (2013.01); G01R 33/543 (2013.01); G01R 33/5608 (2013.01); G01R 33/56545 (2013.01);
Abstract

In a method for correcting influences on magnetic resonance imaging of an examination object caused by fluctuations in a basic magnetic field, an MR data set is generated for two or more measurement periods, and a regression analysis is performed. Each of the MR data sets may contain at least one two-dimensional individual data set. The regression analysis may determine at least one phase correction value for a measurement period to be corrected. Two or more different individual data sets may be taken into account in the analysis. An MR image may generated based on the MR data sets and the at least one phase correction value.


Find Patent Forward Citations

Loading…