The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2023
Filed:
May. 03, 2021
Aktiebolaget Skf, Gothenburg, SE;
Skf Aerospace France S.a.s, Montigny-le-Bretonneux, FR;
Paul Heinrich Michael Boettger, Linz, AT;
Victor Brizmer, Utrecht, NL;
Herve Carrerot, Vicq, FR;
Yoann Hebrard, Sarras, FR;
Charlotte Vieillard, Woerden, NL;
Aktiebolaget SKF, Gothenburg, SE;
SKF Aerospace France S.A.S., Montigny-le-Bretonneux, FR;
Abstract
Method for detecting at least one critical defect in a ceramic rolling element providing the steps of capturing a plurality of two-dimensional digital radiographic images of the ceramic rolling element; digitally filtering each radiographic image; delineating, on the basis of the filtered image, at least one region liable to comprise the critical defect; constructing stereoscopically a virtual model of the ceramic rolling element having the region; comparing the dimensions of the delineated region with a plurality of predetermined threshold values, and, when the dimensions are greater than the threshold values, generating an alarm signal.