The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Mar. 24, 2020
Applicant:

P&k Skin Research Center, Seoul, KR;

Inventors:

Jin-Hee Shin, Seoul, KR;

Nu-Ri Yang, Seoul, KR;

Jin-Oh Park, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01N 21/65 (2013.01); G01N 2021/651 (2013.01);
Abstract

A three-dimensional Raman image mapping measuring device for a flowable sample according to an embodiment of the present disclosure is designed to be capable of measuring a flowable sample during mapping measurement of a three-dimensional image that is a region of a confocal Raman by using a micro Raman spectrometer and a three-axis sample stage (Piezo stage). The three-dimensional Raman image mapping measuring device for a flowable sample includes at least one piezo element; an element holder equipped with the piezo element and having an opening, a sample stage for supporting the element holder equipped with the piezo element, an objective lens mounted in the opening in the element holder, a sample holder for controlling vertical movement of the flowable sample disposed under the lower portion of the sample stage, and a transparent window disposed between the sample stage and the sample holder.


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