The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Mar. 24, 2021
Applicant:

Caterpillar Inc., Peoria, IL (US);

Inventors:

Tod A. Oblak, Pittsburgh, PA (US);

Lyle Taylor, Export, PA (US);

James Peterson, Denison, TX (US);

Carl Hendricks, Mosman Park, AU;

John F. Halterman, Sherman, TX (US);

Lawrence A. Mianzo, Pittsburgh, PA (US);

Narayana G. Nadukuru, Sewickley, PA (US);

Assignee:

Caterpillar Inc., Peoria, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/3563 (2014.01); E21B 21/015 (2006.01); G01N 21/359 (2014.01); E21B 49/00 (2006.01); E21B 7/02 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3563 (2013.01); E21B 21/015 (2013.01); E21B 49/005 (2013.01); G01N 21/359 (2013.01); E21B 7/02 (2013.01);
Abstract

A system, method, and apparatus for real-time characterization of drilled particles during a drilling operation can be comprised of a light illumination source to output short-wave-infrared (SWIR) light toward the drilled particles as the drilled particles exit a drill hole being drilled by a drilling machine; a sensor to sense reflected short-wave-infrared (SWIR) light reflected from the drilled particles exiting the drill hole; and processing circuitry operatively coupled to at least the sensor. The processing circuitry can be configured to determine a spectrum of the reflected short-wave-infrared light sensed by the sensor, and determine particle characterization for a portion of the drilled particles by performing hyperspectral analysis on the determined spectrum and based on predetermined candidate particle characterizations.


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