The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Jul. 07, 2021
Applicant:

Oren Aharon, Haifa, IL;

Inventor:

Oren Aharon, Haifa, IL;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 11/02 (2006.01); G01B 11/27 (2006.01);
U.S. Cl.
CPC ...
G01M 11/0221 (2013.01); G01B 11/272 (2013.01);
Abstract

A method and apparatus for a structured light measuring device, having a preferable VCSEL array in its previous illuminated cross plane, using the laser array to be projected through said device's objective and collect the reflected beams through the same objective lens. A motorized stage is attached to the objective focusing, enabling back and forth focusing on different external planes. A software algorithm running on a computer device will analyze the reflected laser beam and find its central point and further translate it to angular deviations, similar to Autocollimation principles. Furthermore, this could be displayed as a cross on the user GUI for better user interface. The focusing function has the capability to focus the laser array at various planes, and analyze if the reflected beam is at its best focal point or deviates. By moving the focal point back and forth, a 3-D reconstruction can be achieved, preferable for lenses and calculating the center location relative to the device's line of sight.


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