The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2023
Filed:
Oct. 20, 2022
Hebei University of Technology, Tianjin, CN;
Other;
Abstract
A discontinuous deformation measurement method based on infrared and visible light cameras may include: preparing a conductive film and a random speckle pattern on a surface of the conductive film; obtaining a visible image and an infrared image under a loading stage; applying a crack boundary detection to the visible image to obtain an initial coordinate of a micro-crack, determining an range of the micro-crack based on a temperature-rising region from the infrared image and the initial coordinate; setting a position corresponding to the range of the micro-crack in the visible image as a new region of interest; obtaining full-field principal tensile strains by a DIC method, and locating an accurate boundary of the micro-crack based on gradient distribution of the full-field principal tensile strains; analyzing displacement and strain fields around the micro-crack using the DIC method.
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