The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Jan. 13, 2021
Applicants:

Tsinghua University, Beijing, CN;

Hon Hai Precision Industry Co., Ltd., New Taipei, TW;

Inventors:

Lin Cong, Beijing, CN;

Zi Yuan, Shenzhen, CN;

Kai-Li Jiang, Beijing, CN;

Shou-Shan Fan, Beijing, CN;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/56 (2006.01); G01J 1/04 (2006.01); C01B 32/158 (2017.01);
U.S. Cl.
CPC ...
G01J 1/56 (2013.01); C01B 32/158 (2017.08); G01J 1/04 (2013.01); C01B 2202/06 (2013.01);
Abstract

A device for measuring a light radiation pressure is provided which includes a torsion balance, a laser, a convex lens, and a line array detector. The laser is configured to emit a first laser beam. The convex lens is located on an optical path of the first laser beam and configured to focus the first laser beam to a surface of the reflector. The line array detector is configured to detect a reflected first laser beam reflected by the reflector. The disclosure also provides a method for measuring the light radiation pressure using the device.


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