The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2023
Filed:
Oct. 29, 2019
Applicant:
Asp Global Manufacturing Gmbh, Schaffhausen, CH;
Inventors:
Doug Vo Truong, Irvine, CA (US);
Todd Morrison, Dana Point, CA (US);
Assignee:
ASP GLOBAL MANUFACTURING GMBH, Schaffhausen, CH;
Primary Examiner:
Int. Cl.
CPC ...
A61L 2/24 (2006.01); F26B 5/04 (2006.01); A61B 1/12 (2006.01); A61L 2/20 (2006.01); F26B 9/06 (2006.01); F26B 21/10 (2006.01);
U.S. Cl.
CPC ...
F26B 5/042 (2013.01); A61B 1/121 (2013.01); A61L 2/20 (2013.01); A61L 2/24 (2013.01); F26B 9/06 (2013.01); F26B 21/10 (2013.01); A61L 2202/122 (2013.01); A61L 2202/24 (2013.01);
Abstract
A method of using a vacuum chamber to assist in detecting and removing moisture from an instrument having a lumen, e.g., an endoscope is disclosed. Second derivatives of pressure with respect to time are calculated and differences therebetween summed. These summations may be compared to a threshold value to determine whether residual moisture remains on the instrument in the chamber. The vacuum chamber may include a rack for hanging instruments having lumens, such as endoscopes.