The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Jun. 12, 2020
Applicant:

Baker Hughes Oilfield Operations Llc, Houston, TX (US);

Inventors:

Nasr Alkadi, Oklahoma City, OK (US);

Ammar Abdilghanie Mohammed, Oklahoma City, OK (US);

Mahendra Joshi, Houston, TX (US);

Bilal Zoghbi, Oklahoma City, OK (US);

Valeria Di Filippo, Houston, TX (US);

Pejman Kazempoor, Oklahoma City, OK (US);

Jianmin Zhang, Houston, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F01N 11/00 (2006.01); F02D 41/22 (2006.01); G07C 5/00 (2006.01); G07C 5/08 (2006.01); G01M 3/00 (2006.01); G01N 21/3504 (2014.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
F02D 41/22 (2013.01); F01N 11/007 (2013.01); G01M 3/007 (2013.01); G01N 21/3504 (2013.01); G07C 5/006 (2013.01); G07C 5/0816 (2013.01); F02D 2041/225 (2013.01); G01N 33/0004 (2013.01);
Abstract

Systems, methods, and a computer readable medium are provided for monitoring and detecting a gas emission. Sensor data including gas concentration and wind data associated with a gas emission from an emission source is received from Near-Field and Far-Field sensors configured within a gas production and distribution environment. The sensor data can be provided as inputs to a Near-Field dispersion model to determine an emission rate associated with the gas emission and one or more source locations associated with the gas emission. The emission rate can be included in emission data and provided for output. Related apparatus, systems, techniques, and articles are also described.


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