The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Apr. 24, 2018
Applicant:

Sumco Corporation, Tokyo, JP;

Inventors:

Taisuke Mizuno, Saga, JP;

Kazumi Inagaki, Ibaraki, JP;

Shin-ichiro Fujii, Ibaraki, JP;

Assignee:

SUMCO CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B05B 7/24 (2006.01); H01J 49/04 (2006.01); H01J 49/10 (2006.01);
U.S. Cl.
CPC ...
B05B 7/2408 (2013.01); B05B 7/2497 (2013.01); H01J 49/045 (2013.01); H01J 49/0445 (2013.01); H01J 49/105 (2013.01); B05B 7/2424 (2013.01);
Abstract

Provided is a spray chamber including a sample introduction port portion into which a gas flow containing sample droplets that have been atomized by a nebulizer is introduced, a discharge port portion that discharges at least a part of the gas flow introduced into the sample introduction port portion to the outside, and a flow passage tube portion that has the sample introduction port portion on one end portion thereof and the discharge port portion on the other end portion thereof and serves as a flow passage for the introduced gas flow, wherein the flow passage tube portion includes a first tube portion having the discharge port portion on one end portion thereof and a second tube portion having the sample introduction port portion on one end portion thereof, the spray chamber includes a double tube portion.


Find Patent Forward Citations

Mizuno, Taisuke. (2023). Spray chamber, sample atomization and introduction device, analysis device, and method of analyzing component in sample (U.S. Patent No. 11648574). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11648574

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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