The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2023
Filed:
Jun. 21, 2019
Applicant:
Siemens Healthcare Gmbh, Erlangen, DE;
Inventors:
David Grodzki, Erlangen, DE;
Hans Weber, Erlangen, DE;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/055 (2006.01); G01R 33/56 (2006.01);
U.S. Cl.
CPC ...
A61B 5/055 (2013.01); A61B 5/0046 (2013.01); A61B 5/7207 (2013.01); G01R 33/56 (2013.01);
Abstract
In a method and apparatus for determining an examination duration tolerable by a patient in and/or on a diagnostic examination device, the patient to be examined is observed at least in a preliminary stage of the examination concerned, during which measurement parameters are ascertained. From the measurement parameters, an algorithm determines a statement about the dwell capability of the patient in the examination device. The algorithm can be an artificial neural network.
Grodzki, David. (2023). Method and diagnostic examination device for estimating an examination duration that is tolerable by a patient (U.S. Patent No. 11647918). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11647918
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile