The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Aug. 02, 2018
Applicant:

Kyocera Corporation, Kyoto, JP;

Inventor:

Susumu Kashiwase, Machida, JP;

Assignee:

KYOCERA Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/0205 (2006.01); A61B 5/00 (2006.01); A61B 5/1455 (2006.01); A61B 5/0285 (2006.01); A61B 5/026 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0205 (2013.01); A61B 5/0261 (2013.01); A61B 5/0285 (2013.01); A61B 5/14551 (2013.01); A61B 5/6815 (2013.01); A61B 5/742 (2013.01); A61B 5/7405 (2013.01); A61B 5/7455 (2013.01);
Abstract

A measurement apparatus includes a plurality of sensors wearable on different parts of a human body and a controller configured to acquire an output value of each of the sensors. The sensor each outputs an output value to calculate the same type of biological information by optical measurement, the controller selects either the sensor on the basis of each output value of the sensors, and determines a measured value of the biological information on the basis of an output values of the sensors selected.


Find Patent Forward Citations

Kashiwase, Susumu. (2023). Measurement apparatus and measurement method (U.S. Patent No. 11647911). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11647911

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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